Identification of major quantitative trait loci for root diameter in synthetic hexaploid wheat under phosphorus-deficient conditions
Fangkun Wu 1,Xilan Yang 1,Zhiqiang Wang 1,Mei Deng 1,Jian Ma 1,Guoyue Chen 1,Yuming Wei 1,Yaxi Liu1
1.Triticeae Research InstituteSichuan Agricultural UniversityChengduChina
Plant Genetics • Original Paper
First Online: 08 September 2017
Synthetic hexaploid wheat (SHW) possesses numerous genes for resistance to stress, including phosphorus (P) deficiency. Root diameter (RDM) plays an important role in P-deficiency tolerance, but information related to SHW is still limited. Thus, the objective of this study was to investigate the genetic architecture of RDM in SHW under P-deficient conditions. To this end, we measured the RDM of 138 F9 recombinant inbred lines derived from an F2 population of a synthetic hexaploid wheat line (SHW-L1) and a common wheat line (Chuanmai32) under two P conditions, P sufficiency (PS) and P deficiency (PD), and mapped quantitative trait loci (QTL) for RDM using an enriched high-density genetic map, containing 120,370 single nucleotide polymorphisms, 733 diversity arrays technology markers, and 119 simple sequence repeats. We identified seven RDM QTL for P-deficiency tolerance that individually explained 11–14.7% of the phenotypic variation. Five putative candidate genes involved in root composition, energy supply, and defense response were predicted. Overall, our results provided essential information for cloning genes related to P-deficiency tolerance in common wheat that might help in breeding P-deficiency-tolerant wheat cultivars.
Keywords：Recombinant inbred lines Synthetic hexaploid wheat Quantitative trait locus Phosphorus deficiency Root diameter
